Author: "JHA, NIRAJ K./KUNDU, SANDIP Title: Testing and Reliable Design of CMOS Circuits
Description: Spublisher, "1990. Kluwer Academic Publishers, Boston, 1990. 231 pages, Paperback - former library book in good condition - Einband: "gebundene Bücher. 574
Keywords: "Technik
Price: EUR 10.00 = appr. US$ 10.87 Seller: Celler Versandantiquariat
- Book number: "2g4875