Ask a question or
Order this book


Browse our books
Search our books
Book dealer info



Title: From Contamination to defects, faults and yield Loss. Simulation and Applications
Description: Spublisher, "1996. Kluwer Academic Publishers, Boston, 1996. 150 pages, Paperback - former library book in good condition - Einband: "gebundene Bücher. 468

Keywords: "Technik

Price: EUR 20.00 = appr. US$ 21.74 Seller: Celler Versandantiquariat
- Book number: "2g4862