Author: "BARDELL, PAUL H./ MCANNEY, WILLIAM/ SAVIR, JACOB
Title: Built-In Test For VLSI: Pseudorandom Techniques
Description: Spublisher, "1987. John Wiley & Sons, New York, 1987. XIII, 354 pages with some graphics, cloth cover in dust jacket, (former library book) Einband: "Leineneinband. 654

Keywords: "Technik